FIGR / UI TEMPLATE
Compare AOI, functional and thermal defects across assembly runs.
Explore this analytics as a reference for Electronics Manufacturing & Device Testing software. The sample records include Solder bridge 34% and Open joint 21%. Use their tasks and edge cases to adapt this pattern to your own product and design system. All examples are fictional.

BUILD ON THIS
Explore this screen, then bring in your own product and design system to shape the next version.
Analytics
Explore insights
analytics with searchable records, filters, selection and status feedback
Default, Selected, Filtered, Empty, Loading, Warning, Error, Success
Independent product UI reference; no 1mg assets
Review Solder bridge 34% against Open joint 21%, spot blockers and explore insights while preserving ownership and status.
Production → Testing → Explore insights
analytics, record selection, filtering, status chips, sample task feedback
Label time ranges, measures and missing data.
Help our team adapt Manufacturing Defect Pareto to an existing product. Read our Figma design system, current flows, components, data rules and permissions. Explore two workable layouts for explore insights with sample cases like Solder bridge 34% and Open joint 21%. Build a design our team can edit, including default, selected, filtered, empty, loading, warning, error and success states. Treat these sample records as fictional.
KEEP EXPLORING
Browse other product UI examples, compare patterns, and pick the direction that suits your product.